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Measuring technology

SEM (scanning electron microscopy)

The scanning electron microscopy (SEM) has the great advantage of being able to analyze elements by means of energy dispersive or wavelength dispersive X-ray spectroscopy (EDX/ WDX). EDX as well as WDX are used to determine the qualitative and quantitative concentration of elements in micro volumes of solid state bodies.
SEM picture
SEM picture

FTIR (Fourier-Transform-Infrared)

The IR spectroscopy benefits from the absorption of infrared radiation by chemical substances to mainly determine the structures of organic substances. The IR spectroscopy is predominantly used for the identification of plastic material, such as thermoplastics, elastomers, duroplastics, rubber, varnishes, adhesives, etc.
FTIR
FTIR

XRF (X-ray Fluorescence)

The X-ray fluorescence belongs to material analytics. It is one of the most frequently used methods for the qualitative and quantitative determination of the elementary composition and the layer thickness measurement of a specimen.
XRF
XRF

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Combined Tests

  • Burn-in and run-in: e.g. for ceramic capacitors as per MIL-STD-202
  • Temperature change with superimposed electric load: down to -50°C and 1.5kW electric dissipation loss of the test object, e.g. test as per VW 800.00 Life Cycle, Internal Power Cycling
  • Climate and climate change test with superimposed electric load for the evaluation of corrosion resistance and creep leakage resistance, e.g. CAF test as per IPC-9691
  • Contact test, e.g. milliohm measurement down to 0.1 µO and insulation resistance up to 2x10 E15 O under climate
  • Discharge capacity of ESD materials
Combined tests
Combined tests

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